Author(s): Simbrunner J; Schrode B; Domke J; Fritz T; Salzmann I; Resel R;

Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientations of the adsorbate, several symmetry-related in-plane alignments and the occurrence of unknown po ...

Article GUID: 32356785

Author(s): Simbrunner J, Simbrunner C, Schrode B, Röthel C, Bedoya-Martinez N, Salzmann I, Resel R

Acta Crystallogr A Found Adv. 2018 Jul 01;74(Pt 4):373-387 Authors: Simbrunner J, Simbrunner C, Schrode B, Röthel C, Bedoya-Martinez N, Salzmann I, Resel R

Article GUID: 29978847

Author(s): Simbrunner J; Hofer S; Schrode B; Garmshausen Y; Hecht S; Resel R; Salzmann I;

Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expressions for indexing experimental diffraction patterns of ...

Article GUID: 30996719